Table 2

Summary of different TE materials under low-temperature conditions

MaterialsMajority carriersTemperature: KZT valueReferences
Bi85Sb14Pb1Holes190–2100.11–0.12Chen et al.95,96 
Bi77.1Sb22.9Holes2400.13Jin et al.97 
Bismuth telluride4230.61Kim et al.98 
AgSbSe0.25Te1.75Holes5200.65Wojciechowski and Schmidt99 
Bismuth tellurideElectrons300–4750.68–1.16Guo et al.,100 Bao et al.,101 Akshay et al.,102,103 Yang et al.,104 Nour et al.,105 Saleemi et al.,106 Wu et al.107 
CsBi4Te6Holes2250.82Chung et al.108 
(Bi2Te3)0.9(Bi1.9Cu0.1Se3)0.1Electrons4170.98Cui et al.109 
SiliconHoles200∼1.00Boukai et al.110 
Bi2(Te,Se)3Electrons3001.01Tan et al.111 
MgAgSb0.99In0.01Holes525∼1.10Ying et al.112 
Bi2Te2.7Se0.3Electrons300–4800.85–1.27Yan et al.,113 Hong et al.,114 Tan et al.,115 
(Bi2Te3)0.24(Sb2Te3)0.76Holes3501.14Jiang et al.116 
Bi2Te2.5Se0.5Electrons300–4631.18–1.28Xu et al.,117 Tan et al.118 
Bi2Te2.3Se0.69Electrons450∼1.20Zhai et al.119 
Bi2Te2.79Se0.21Electrons3571.20Hu et al.120 
Bi2Te2.88Se0.15Electrons298–4231.18–1.22Kim et al.121 
Bi0.3Sb1.7Te3Holes3801.30Hu et al.122 
(Bi2Te3)0.20(Sb2Te3)0.80Holes3981.33Di et al.123 
BiSbTe bulk alloyHoles300–3731.20–1.40Poudel et al.124 
Bi0.4Sb1.6Te3Holes300–3981.20–1.41Jimenez et al.,125 Chen et al.,126 Yeo and Oh127 
(Bi,Sb)2Te3Holes2731.41Fan et al.128 
(Bi,Sb)2Te3 bulk compositesHoles4401.47Cao et al.129 
Bi0.48Sb1.52Te3Holes3901.50Xie et al.130 
Bi0.52Sb1.48Te3Holes300∼1.56Xie et al.131 
Bi0.50Sb1.50Te3Holes300–3231.56–1.80Jiang et al.,132 Lv et al.133 
PbSnSeTe3002.00Harman et al.134 
Tellurium-embedded bismuth tellurideElectrons3752.27Choi et al.135 
Iodine-doped copper (I) selenide4002.30Liu et al.136 
Bismuth telluride/Sb2Te3 superlatticeHoles300∼2.40Venkatasubramanian et al.137 

Majority carriers: holes (p type) and electrons (n type)

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