Figure A1
The image presents a line graph depicting the relationship between resistivity in ohm-centimeters and layer height measured in micrometers. The y-axis indicates resistivity values ranging from four to eleven ohm-centimeters, while the x-axis shows layer heights from two hundred to eight hundred micrometers. There are five distinct data series, each corresponding to different strand widths of two hundred fifty, three hundred, four hundred, five hundred, six hundred, and eight hundred micrometers, represented by various symbols and dashed lines. Each data series is accompanied by shaded error bands that illustrate the variability in resistivity measurements. The graphical layout facilitates comparison across the different strand widths as the data flows from left to right, highlighting the trend of resistivity as layer height increases.Resistivity as a function of layer height for constant strand widths. The line is the mean with the coloured area representing the standard deviation (1σ)
Source: Authors' own work