Figure 12
Two scanning electron microscope images side by side show detailed surfaces of materials, highlighting textures and structures at a high magnification level.The image contains two scanning electron microscope (S E M) images labelled (a) on the left and (b) on the right. Both images display intricate surface textures of materials at a high magnification level of one thousand times. Image (a) has a working distance of fifteen point eighty-two millimetres and a view field of two hundred eighty micrometres, while image (b) has a slightly shorter working distance of twelve point ninety-one millimetres, maintaining the same view field. Each image presents different surface characteristics, with the scale bar indicating fifty micrometres beneath both images. Additional technical information about the S E M settings, including high voltage and detection methods, is present at the bottom.

The fracture imaging of Charpy (a) and tensile sample (b) after T6 heat treatment made in Aluminium 6061-RAM2C. The image was taken with the SEM - Tescan VEGA3 (magnification: 1,000Ă—)

Source: Authors’ own generation

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