Figure 1.
The graph illustrates X ray diffraction patterns with intensity on the vertical axis, labelled as Intensity, a.u., and angle on the horizontal axis, labelled as 2 theta, degree. Six different traces represent distinct samples, C Z T S 400, C Z T S 380, C Z T S 360, C Z T S 340, and C Z T S A D, each corresponding to specific temperatures. Peaks are labelled with Miller indices, including 112, 220, and 321. The data ranges from 20 to 80 degrees. The trace line for each sample varies in colour, and additional markers describe standard peak positions indicated by orange vertical lines, accompanied by a reference number, J P C D 04 023 3974, at the bottom right.X-ray diffraction results of all CZTS thin films annealed at different temperatures