Figure 5
The internal structural analysis of lattice specimens using sectional and microscopic imaging. Panel A shows a three-dimensional lattice specimen labelled Onyx with X, Y, and Z coordinate directions indicated beside the structure. Panel B contains three sectional views along the X-Y orientation displaying wavy internal pathways, material deposition patterns, and localised void regions within the Onyx matrix. Insets in each image show miniature three-dimensional orientation references. Panel C presents corresponding sectional views along the Z-X orientation, highlighting layered deposition structures, internal porosity, and void formation between adjacent material paths. Arrows identify Onyx material regions and void locations throughout the analysed sections.The X-ray CT images of Onyx gyroid structures: (a) a 3D image; (b) a build direction section view; and (c) a side section view
Source: Authors’ own work