Malvern launched new particle shape analyzer at Pittcon 2005

Malvern launched new particle shape analyzer at Pittcon 2005

Keywords: Particle size measurement, Measuring, Testing and instruments

Malvern Instruments launched a new generation image analysis system for the fully automated characterization of particle shape and size at Pittcon 2005 (27 Febuary-1 March 2005, Orlando, USA). The company also exhibited systems from its comprehensive range of analytical instruments for particle size measurement and rheological applications. These included the Zetasizer Nano for the characterization of nano-sized particles, proteins, and molecules in solution;the industry- leading Mastersizer 2000 laser- diffraction-based particle size analyzer; and the Gemini stress and strain controlled rheometer.