RFID and sensor test facility
RFID and sensor test facility
Keywords: Product testing, Sensors
Microsystems has announced that it has combined its RFID Test Center with the Sun Advanced Product Testing (APT) environmental test laboratory to meet the growing demands of customers to test multi-vendor RFID and sensor solutions for the ability to withstand extreme, “real-world” environmental conditions.
Companies from around the world have used the Sun RFID Test Center to simulate thousands of RFID and sensor deployments to verify that multi-vendor solutions are interoperable and meet industry technical standards and mandates. Sun is reorganising the RFID Test Center into its Colorado- based Sun APT lab to add the ability to test RFID and sensor solutions under adverse environmental conditions such as excessive heat and cold, shock, humidity, vibration, altitude and pressure. The new facility is called the Sun APT Lab for RFID and Sensors.
Sun's new APT Lab for RFID and Sensors will be collocated with Sun's existing APT facility in Longmont, CO., with additional operations in Sun's nearby Louisville campus in suburban Denver.
