Post-irradiation examination
Emerald Publishing Limited
ISBN print:
978-0-7277-5173-7
Publication date:
1981
Book Chapter
P25 A remotely operated scanning electron microscope for the examination of irradiated materials
By
V. J. Haddrell;
V. J. Haddrell
Central Electricity Generating Board, Research Division, Berkeley Nuclear Laboratories
Search for other works by this author on:
G. K. Rickards;
G. K. Rickards
Central Electricity Generating Board, Research Division, Berkeley Nuclear Laboratories
Search for other works by this author on:
M. S. Paisey
M. S. Paisey
Central Electricity Generating Board, Research Division, Berkeley Nuclear Laboratories
Search for other works by this author on:
V. J. Haddrell,
G. K. Rickards,
M. S. Paisey
Central Electricity Generating Board, Research Division, Berkeley Nuclear Laboratories
-
Published:1981
Citation
V. J. Haddrell, G. K. Rickards, M. S. Paisey, 1981. "P25 A remotely operated scanning electron microscope for the examination of irradiated materials", Post-irradiation examination
Download citation file:
Open figure viewer
Acknowledgement
You do not currently have access to this chapter.
Related Topics
Email alerts
Related Book Content
Related Articles
Recommended for you
These recommendations are informed by your reading behaviors and indicated interests.
