Closed form solutions of the potential difference between the two depletion layer edges of a single‐diffused Gaussian p‐n junction are obtained by integrating Poisson's equation and equating the positive and negative charges in the depletion layer. Using the closed form solution of the Poisson's equation, the depletion layer width, junction capacitance and junction built‐in potential are calculated. The customary exponential factor m in the expression for the junction capacitance, i.e., Cj α(1 + Va/φ)−m is shown to vary with the applied reverse bias. The value of φ is found to be different from the conventional value of the junction built‐in potential especially at high voltages. A technique for modeling diffused p‐n junctions at various reverse biases is presented. These results will be useful in circuit simulation programs such as SPICE, particularly for applications involving digital integrated circuits.
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1 February 1982
Review Article|
February 01 1982
CAD MODELING OF DIFFUSED p‐n JUNCTIONS Available to Purchase
Krishna SHENAI;
Krishna SHENAI
COMSAT Laboratories, Clarksburg, Maryland 20871 Formerly of the University of Maryland, College Park, Maryland 20742, (USA).
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H.C. LIN
H.C. LIN
Electrical Engineering Department, University of Maryland, College Park, Maryland 20742
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Publisher: Emerald Publishing
Online ISSN: 2054-5606
Print ISSN: 0332-1649
© MCB UP Limited
1982
COMPEL (1982) 1 (2): 111–127.
Citation
SHENAI K, LIN H (1982), "CAD MODELING OF DIFFUSED p‐n JUNCTIONS". COMPEL, Vol. 1 No. 2 pp. 111–127, doi: https://doi.org/10.1108/eb009968
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