In this paper we consider the Boltzmann equation describing the carrier transport in a semiconductor. A modified Chapman‐Enskog method is used, in order to find approximate solutions in the weakly non‐homogeneous case. These solutions allow us to calculate the mobility and diffusion coefficients as functions of the electric field. The integral‐differential equations derived by means of the above mentioned method are numerically solved using a combination of spherical harmonics functions and finite‐difference operators. The Kane model for the electron band structure is assumed; the parabolic band approximation is obtained as a particular case. The numerical values of the mobility and diffusivity in a silicon device are compared with experimental data. The Einstein relation is also shown.
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1 March 2002
Technical Paper|
March 01 2002
High field mobility and diffusivity of an electron gas in silicon devices
S.F. Liotta;
S.F. Liotta
Dipartimento di Matematica e Informatica, University of Catania, Italy
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A. Majorana
A. Majorana
Dipartimento di Matematica e Informatica, University of Catania, Italy
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Publisher: Emerald Publishing
Online ISSN: 2054-5606
Print ISSN: 0332-1649
© MCB UP Limited
2002
COMPEL (2002) 21 (1): 31–44.
Citation
Liotta S, Majorana A (2002), "High field mobility and diffusivity of an electron gas in silicon devices". COMPEL, Vol. 21 No. 1 pp. 31–44, doi: https://doi.org/10.1108/03321640210410724
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