The purpose of this paper is to describe the full‐wave modelling of pulsed terahertz systems utilized in non‐destructive testing.
At the outset, some basic information on the terahertz NDT are outlined and then, general remarks on its numerical modelling are presented. Frequency domain FEM and time domain FDTD analysis is carried out. Finally comparison of computed and measured signals is shown in order to prove numerical analysis correctness.
It is possible to model in a relatively simple way a terahertz system for nondestructive evaluation of dielectric materials. In contrast to other published work, the entire measuring setup is modelled, including photoconductive antenna with hemispherical lens, focusing lens and evaluated material with exemplary defect.
This paper gives a description of the terahertz non‐destructive testing system with comparison of simulated and measured results.
