Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-3 of 3
Keywords: Bayesian statistics
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
COMPEL (2019) 38 (5): 1521–1532.
Published: 07 August 2019
... may be seen at http://creativecommons.org/licences/by/4.0/legalcode Inverse problems Bayesian statistics State reduction Statistical solution Inverse problems are referred to as highly dimensional and ill-posed estimation problems (Tarantola, 2004), where information about a state...
Journal Articles
COMPEL (2017) 36 (5): 1430–1441.
Published: 04 September 2017
... space Tomography Bayesian statistics Inverse problems are estimation problems to draw information about an inner state of a system from indirect observations/measurements (Kaipio and Somersalo, 2004). Inverse problems are marked by an ill-posed nature, and are typically of high dimension...
Journal Articles
COMPEL (2002) 21 (1): 98–115.
Published: 01 March 2002
... T=time to failure © MCB UP Limited 2002 Bayesian statistics Predictive techniques Electrical devices μ=mean value θ=threshold value AMP=age maintenance program cdf=cumulative distribution function CLT=Central Limit Theorem DA=Discriminant...
