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Keywords: C–V characteristic
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Journal Articles
COMPEL (2022) 41 (5): 1660–1676.
Published: 24 March 2022
.../approach A Riemann–Liouville-type fractional-order equivalent model is proposed for the C–V characteristic of MOSFETs, which is based on the mathematical relationship between fractional calculus and the semiconductor physical model for the interelectrode capacitance of metal oxide...
