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COMPEL (2010) 29 (4): 1081–1089.
Published: 13 July 2010
...Sławomir Wiak; Ewa Napieralska‐Juszczak; T. Hacib; H. Acikgoz; Y. Le Bihan; M.R. Mekideche; O. Meyer; L. Pichon Purpose The dielectric properties of materials (complex permittivity) can be deduced from the admittance measured at the discontinuity plane of a coaxial open‐ended probe. This implies...
Journal Articles
Journal Articles
COMPEL (2005) 24 (1): 291–304.
Published: 01 March 2005
...Vadim V. Yakovlev; Ethan K. Murphy; E. Eugene Eves Purpose To outline different versions of a novel method for accurate and efficient determining the dielectric properties of arbitrarily shaped materials. Design/methodology/approach Complex permittivity is found using an artificial neural...

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