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Keywords: Electron microscope
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Journal Articles
A boundary element analysis of magnetic shielding for electron microscopes
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COMPEL (1998) 17 (5): 585–594.
Published: 01 October 1998
...H. Igarashi; A. Kost; T. Honma This paper describes a boundary element analysis of magnetic shieldings for electron microscopes. Since the thickness of the shielding layer is considerably small compared with its overall size, numerical analysis of electromagnetic fields inside the layer leads...
