Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-8 of 8
Keywords: Methods
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
COMPEL (2008) 27 (1): 215–223.
Published: 04 January 2008
... and the media are described by a boundary element method (BEM) approach, while the sensor is treated by micromagnetism in order to reconstruct the response of shielded multitrack MR head. To select the most favorable approach, several releases were implemented and compared. A technique based on a full‐coupling...
Journal Articles
COMPEL (1997) 16 (2): 108–122.
Published: 01 June 1997
... an improved numerical computation of the eigenmodes is presented. Avoids the time‐ and memory‐consuming computation of all eigenvalues in order to calculate a selected set of propagation constants using an iterative method that is carried out twice. The numerical effort and the storage requirements can...
Journal Articles
COMPEL (1997) 16 (2): 92–107.
Published: 01 June 1997
... of point sources approximating the multiline distributions. The range of validity of the low‐frequency expansion is estimated by comparing with results obtained using the T‐matrix method. Electrical engineering Mathematics Methods Theory The theory of electromagnetic scattering by particles...
Journal Articles
COMPEL (1996) 15 (4): 36–47.
Published: 01 December 1996
...A. El Boukili Shows how a strongly non‐linear semiconductor equation can be solved via homotopy deformation methods combined with the arclength continuation procedures. The fundamental goal of these methods is to overcome the instabilities or the failure of the classical Newton‐Raphson’s schemes...
Journal Articles
COMPEL (1996) 15 (4): 48–62.
Published: 01 December 1996
...A. Saadi; L. Pichon Presents a new method to compute simultaneously the near and the far field in electromagnetic 3D scattering problems. In this approach a bounded spherical domain contains all the inhomogeneous objects and divides the whole space into two different regions. In both regions...
Journal Articles
COMPEL (1996) 15 (4): 63–81.
Published: 01 December 1996
...D.M. Spink Presents a direct solution method for the determination of the capacitance, conductance or inductance of static linear problems with the dual finite element method. The direct solution method provides an entirely energy‐based method for the calculation of these global parameters...
Journal Articles
COMPEL (1996) 15 (4): 5–20.
Published: 01 December 1996
...Xunlei Jiang Uses a streamline‐diffusion finite element method, specially designed for semiconductor device models, to simulate silicon MESFET devices in two space dimensions. Considers the full hydrodynamic model, a simplified hydrodynamic model and drift‐diffusion model. The method, which reduces...
Journal Articles
COMPEL (1996) 15 (4): 21–35.
Published: 01 December 1996
...S. Caorsi; P. Fernandes; M. Raffetto Spurious modes often appear in the computed spectrum when an electromagnetic eigenproblem is solved by the finite element method. Demonstrates that the inclusion condition, often claimed as the theoretical reason for the absence of (non‐zero frequency) spurious...
