Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-2 of 2
Keywords: Microscopes
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Visual detection of sub‐surface defects using enhanced eddy current microscope
Available to Purchase
COMPEL (2010) 29 (2): 347–354.
Published: 09 March 2010
...TianQuan James Deng; Yu‐hua Cheng; Shu‐yan Jiang; Gang Luo Purpose The purpose of this paper is to introduce a new device with eddy current microscope (ECM) to test the invisible and buried subsurface flaws in metallic specimens. Design/methodology/approach When coil is excited by intermittent...
Journal Articles
Numerical computation of magnetic fields applied to magnetic force microscopy
Available to Purchase
COMPEL (2009) 28 (1): 120–129.
Published: 02 January 2009
...Stanislaw Gratkowski; Andrzej Brykalski; Ryszard Sikora; Thomas Preisner; Michael Greiff; Uzzal Binit Bala; Wolfgang Mathis Purpose The purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step...
