...Boguslaw Grzesik; Zbigniew Kaczmarczyk; Jacek Junak The paper presents the simplified model of the Class E inverter in which the MOSFET transistor is based on the piecewise‐linear (PWL) model. The model does not contain inductances. The PWL description makes it possible to obtain the model...

...Andrzej Demenko; Lech Nowak Presents a method for the finite element (FE) analysis of saturation effects in a squirrel‐ cage electrical machine. The proposed mathematical model includes the FE equations of the electromagnetic field, the equations which define the connection of windings...

... parameter description with another, well‐known variational method called “Tubes and Slices”. Shows that by aligning the finite element mesh with the approximate positions of the equipotentials and flux lines in the system, the dual finite element model can be simplified to the equivalent of Tubes and Slices...

...Michel Fortin; Geng Yang Proposes a finite element method for numerical simulation of the hydrodynamic model of semiconductor devices. Presents some scaling factors and a variational formulation. Uses the P₁ ‐ isoP₂ element to discretize this formulation...

... in others. Semiconductor nanostructures have become so small that we have to take into account quantum effects. The two dimensional physical model consists of Poisson’s equation for the electrostatic potential φ, coupled with an eigenvalue problem for Schrödinger’s equation. Proposes © MCB UP...

...A. Caddemi; M. Sannino Noise parameters of high electron mobility transistors (HEMT) at microwave frequencies are a subject of active research since the knowledge of their performance is of key importance for the use of these devices for designing low‐noise amplifiers. Employs a simple noise model...

... the finite element model of the system can be solved in order to determine energy‐related parameters such as capacitance. Hence the direct solution method will produce exactly the same value for the determined parameters as the conventional finite element solution, and the error analysis is the same...