Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-3 of 3
Keywords: Statistical analysis
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Design concepts of low-frequency electromagnetic devices based on a data-driven approach
Available to Purchase
COMPEL (2019) 38 (5): 1374–1385.
Published: 08 August 2019
... by performing a statistical analysis and exploring optimal and sub-optimal designs considering various targets such as efficiency, torque ripple and power factor. Findings It is demonstrated that the correlation of the design parameters influences the way the data-driven approach must be made. Also...
Journal Articles
Statistical analysis of peak inrush current: a case study
Available to Purchase
COMPEL (2018) 37 (3): 1069–1084.
Published: 08 May 2018
... the admissible line load and trigger the overcurrent protective devices. Design/methodology/approach The paper presents results of laboratory tests together with their statistical analysis of the inrush currents of lighting luminaires. Three road luminaires build in different technologies of similar power...
Journal Articles
Statistical soft error rate estimation of combinational circuits using Bayesian networks
Available to Purchase
COMPEL (2016) 35 (5): 1760–1773.
Published: 05 September 2016
... Publishing Limited Licensed re-use rights only Reliability Statistical analysis CAD Circuit analysis Fault analysis Bayesian network Single event transient (SET) Soft error Process variation Due to the steady decline in CMOS technology scaling, the sensitivity of circuits to high...
