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Keywords: Gate oxide reliability
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Journal Articles
Journal:
Circuit World
Circuit World (2022) 48 (4): 451–463.
Published: 15 July 2021
...Ramneek Sidhu; Mayank Kumar Rai Purpose This paper aims to present the edge scattering dominant circuit modeling. The effect of crosstalk on gate oxide reliability (GOR), along with the mitigation using shielding technique is further studied. Design/methodology/approach An equivalent...
