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Keywords: Health state assessment
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Journal Articles
Journal:
Circuit World
Circuit World 1–12.
Published: 19 March 2026
... and electrical field stress, which leads to a continuous increase in the density of charge traps within the oxide, leading to a significant drift in the threshold voltage (Ugur et al., 2019). The degradation process can be expressed as follows: SiC MOSFET Health state assessment Power devices...
