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Keywords: Radiography
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Journal Articles
The application of X‐rays in the failure analysis of electronic devices and systems
Available to Purchase
Journal:
Circuit World
Circuit World (2008) 34 (3): 31–39.
Published: 22 August 2008
...C.A. Smith Purpose The aim is to focus on the application of X‐rays in the failure analysis of electronic devices and systems, with an emphasis on X‐ray radiography and X‐ray spectroscopy. Design/methodology/approach The theory behind X‐ray radiography and X‐ray spectroscopy is reviewed...
Journal Articles
Failure analysis of electronic components and interconnection systems
Available to Purchase
Journal:
Circuit World
Circuit World (2007) 33 (1): 15–21.
Published: 13 February 2007
... include X‐ray radiography, optical microscopy and scanning electron microscopy/energy dispersive X‐ray spectroscopy, are used. Findings Examples from recent case studies are given to illustrate the work. Originality/value The paper demonstrates how the failure analysis of an electronic component...
