Keywords: Statistical process control
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Journal Articles
Journal Articles
Circuit World (2002) 28 (1)
Published: 01 March 2002
... A brand-new statistical process control package is now available for the Excalibur and phasor systems. This package is able to generate log files containing relevant information from an individual or a batch of panels undergoing optical test. AOT finds the defects and the SPC function...

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