Keywords: Stress
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Journal Articles
Journal Articles
Circuit World (1996) 22 (2): 16–18.
Published: 01 August 1996
... stresses could lead to the growth of‘latent defects’, not easily identifiable during final stage acceptance tests, that could lead the PCB's failure during service. The paper discusses degradation mechanisms which can lead to dielectric failure, together with first results relevant to a wider research...

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