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Keywords: Stress analysis
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Journal Articles
Interconnect stress testing (IST) – an overview of its development and capabilities
Available to Purchase
Journal:
Circuit World
Circuit World (2003) 29 (2): 20–26.
Published: 01 June 2003
... of interconnect failure (10 per cent increase in resistance). © MCB UP Limited 2003 Interconnection Stress analysis Printed circuit boards Interconnect stress testing (IST) arose from the need to provide a new stress testing method for printed circuit boards (PCBs) that was fast, repeatable...
