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Keywords: Temperature reliability
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Journal Articles
Journal:
Circuit World
Circuit World (2017) 43 (3): 111–117.
Published: 07 August 2017
...Qian Lin; Haifeng Wu; Xi Li Purpose The purpose of this paper is to investigate the temperature reliability for a parallel high-efficiency class-E power amplifier (PA). Design/methodology/approach To explore the relationship between temperature and direct current (DC) characteristics, output...
