Keywords: Whisker formation
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Circuit World (2001) 27 (2): 17–20.
Published: 01 June 2001
... of deposits. The lack of an industry standard whisker test is a significant limitation in addressing tin whiskers. Historically in the electronics industry, addition of lead (Pb) was found to be an effective method of minimizing tin whisker formation and so for many years electronic components have been...

or Create an Account

Close Modal
Close Modal