...Xiaotong Shu; Guo Ye; Yang Weiwei; Zhenzhi He; Lianchao Sheng; Xiangning Lu Purpose This paper explores the application of supervised learning algorithms in the field of wafer defect detection. With the development of the consumer electronics industry, more advanced packaging technology...

...Lih-Ping Huang; Quang-Cherng Hsu; You-Rui Lai; Ying-Xin Cai Purpose This study aimed to apply deep learning, using the YOLOv5 object detection method, to automate defect detection in internal threads of fasteners, replacing traditional manual inspection methods that are inadequate for meeting...