... to identify defects and pinpoint corresponding process issues. Design/methodology/approach This paper focuses on the application of supervised learning algorithms in the field of wafer defect detection. The advantages and limitations of algorithms such as RF, CNN classifiers, KNN, SVM, U-NET and YOLO...

.... Consequently, this study developed an intelligent automated system based on the You Only Look Once (YOLO) version 5 (YOLOv5) object detection model to recognize and classify internal thread defects. In this system, image vision techniques combined with deep learning algorithms facilitate the inspection...