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Oleg Kiprijanovič
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Journal Articles
Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses
Available to PurchaseLinas Ardaravičius, Skirmantas Keršulis, Oleg Kiprijanovič, Česlovas Šimkevicius, Bonifacas Vengalis
International Journal of Structural Integrity (2016) 7 (5): 607–616.
Published: 03 October 2016
