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Backscattered electron (BSE) imaging has been widely used to investigate the microstructure of cement-based materials, and it has shown specific advantages in determining the fractions and distribution of individual phases. The lower and upper grey level thresholds for the investigated phases need to be determined as the key references for BSE image analysis. However, the traditional determination of the grey level thresholds for phases is quite arbitrary. A novel method is proposed to analyse BSE images of cement-based materials using statistical analysis, avoiding the subjective choice of grey level thresholds.

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