Magnetoresistance of Co/Cu multilayer thin films

Multilayer nanostructures of ferromagnetic/nonmagnetic/ferromagnetic (Co/Cu/Co) thin films have been investigated in this study. The magnetoresistance was estimated by varying the thickness of the nonmagnetic spacer layer and the top ferromagnetic layer. The magnetic field was applied parallel to the current, and the simulation was performed using Simulmag beta 2.0 software package. The spacer layer thickness varied from 0.4 to 2 nm, and the top (free) layer varied from 0.5 to 5 nm. It was observed that the magnetoresistance increases with the number of giant magnetoresistance (GMR) layers (e.g., multilayer GMR) up to a certain value of thickness of the spacer and free layer. The variation in the hysteresis loop was also noticed by changing the polar angle.