Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Issue Section
Date
Availability
1-2 of 2
Keywords: atomic force microscopy
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
UV shielding and transparency of K+-doped Li3VO4 nanostructured superionic conductors
Available to Purchase
Journal:
Emerging Materials Research
Emerging Materials Research (2020) 9 (4): 1103–1112.
Published: 05 October 2020
...; and θ is Bragg’s angle. The values of the crystallite size obtained from Equation 1 are listed in Table 2 . 11 04 2020 07 09 2020 ICE Publishing: All rights reserved 2020 atomic force microscopy doping ionic conductivity A absorbance obtained from...
Journal Articles
Structural study and electrochemical deposition of a copper layer on n-silicon
Available to Purchase
Journal:
Emerging Materials Research
Emerging Materials Research (2020) 9 (2): 396–401.
Published: 27 April 2020
... and atomic force microscopy. As a result, the new n-silicon/copper structure offers many applications possible in various microelectronic fields. 1 D = 0 ⋅ 9 λ / β cos θ where D is the crystallite size; λ is the wavelength of X-rays used for diffraction (1·5406...
