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Lanthanum strontium cobaltite (La1-xSrxCoO3) thin films with 0.1, 0.2, 0.3, and 0.4 mol % strontium were synthesized by spray pyrolysis technique. These thin films were sintered at 1100°C and studied by XRD for confirmation of phase and to find the crystalline size. Field effect scanning electron microscopy surface morphological analysis was done and found to be spherical in shape and spongy. Elemental analyses were done by energy-dispersive atomic X-ray spectroscopy and no phase changes after sintering. Atomic force microscopy studied the morphological structure and it was found that uniformity and roughness increased, the grain size decreased, and the film became more porous. The dielectric constant was measured with a variation of temperature, and it exhibited semiconducting behavior.

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