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1-5 of 5
Keywords: atomic force microscopy
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Journal Articles
Mohamed Toumi, Belgacem Tiss, Noureddine Bouguila, Daniel Cristea, Catalin Croitoru, Ioana Ghiuta, Alexandru Horia Marin, Ioana Laura Velicu, Vasile Tiron, Valentin Craciun, Mabrouk Kraini, Sahbi Alaya, Cacilda Moura, Luis Cunha
Journal:
Surface Innovations
Surface Innovations (2023) 11 (6-7): 352–364.
Published: 21 September 2022
... to support the potential of this material to be used in biomedical applications. (corresponding author: daniel.cristea@unitbv.ro) 05 07 2022 12 09 2022 Emerald Publishing Limited: All rights reserved 2023 anti-bacterial atomic force microscopy doping indium sulfide...
Journal Articles
Journal:
Surface Innovations
Surface Innovations (2022) 10 (2): 150–162.
Published: 10 September 2021
...) atmosphere. The temperature range used here was from room temperature to 700°C at steps of 20°C/min. Atomic force microscopy (AFM) analysis was carried out using an Agilent Pico LE microscope. The XRD patterns of PEO, P(VdF-HFP) and PEO–P(VdF-HFP) blends are given as curves a to h in Figure 1...
Journal Articles
Journal:
Surface Innovations
Surface Innovations (2018) 6 (4–5): 286–294.
Published: 11 July 2018
... and modified samples upon immersion in water. Atomic force microscopy-based measurements visualised the sealing effect of propolis by means of topographical images, local direct-current maps and local impedance spectra of the control and modified films. From the obtained results the authors drew the conclusion...
Journal Articles
Journal:
Surface Innovations
Surface Innovations (2016) 4 (2): 70–75.
Published: 15 August 2015
...Michał Szociński, PhD The paper presents an atomic force microscopy (AFM)-based approach to evaluation of local protective properties of organic coatings. Apart from topography, it provides local AC and DC characteristics of examined coating. The method consists in application of AC voltage...
Journal Articles
Journal:
Surface Innovations
Surface Innovations (2015) 3 (3): 181–189.
Published: 12 June 2015
...Artur Zieliński, AFM In recent years, there is noticeable interest in application of various types of scanning probe microscopy in material science research. One of them is contact atomic force microscopy combined with local impedance measurements, known as nanoscale impedance microscopy...
