The purpose of this study is to address the nonlinear oscillations of single-crystal silicon micro-electromechanical systems (MEMS) accelerometers subjected to mechanical excitation.
The nonlinear behavior was detected and analyzed by using experimental, analytical and numerical approaches. Piezoelectric shaker as a source of mechanical excitation and differential laser Doppler vibrometer in combination with a micro system analyzer were used in the experimental effort. Two types of devices considered included nonencapsulated samples and samples encapsulated in nitrogen gas compressed between two glasses. Numerical and analytical investigations were conducted to analyze the nonlinear response. A novel method has been suggested to calculate the nonlinear parameters. The obtained experimental, numerical and analytical results are in good agreement.
It has been found that the nonlinearity leads to a shift in frequencies and generates higher harmonics, but, most importantly, reveals new phenomena, such as the jump and instability of the vibration amplitudes and phases.
It has been shown that under the constant excitation force, the MEMS device can work in both linear and nonlinear regions. The role of the beat phenomenon has been also addressed and discussed. It has been found that the attributes of the nonlinear response are strongly dependent on the level and duration of the excitation. It is concluded that the nonlinear response of the systems is strongly dependent on the level of the excitation energy. It has been also concluded that larger quality factors are able to enhance dramatically the nonlinear effects and vice versa.
