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Keywords: Degradation
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Journal Articles
Thermal shock and degradation of metallization systems on silicon
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2016) 33 (2): 102–106.
Published: 03 May 2016
...Arkady Skvortsov; Sergey Zuev; Marina Koryachko; Vadim Glinskiy Purpose The purpose of this study is to investigate the mechanisms of degradation of aluminum metallization under conditions of thermal shock caused by rectangular current pulses (amplitude j < 8 × 1010 A/m2...
