Keywords: Design
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Journal Articles
Journal Articles
Microelectronics International (2013) 30 (3): 125–133.
Published: 26 July 2013
...Dominik Jurków Purpose The paper aims to present numerical modeling and technology of a very first three axial low temperature cofired ceramics (LTCC) accelerometer. Design/methodology/approach Low temperature cofired ceramics technology was applied in the fabrication process of the novel...
Journal Articles
Microelectronics International (2007) 24 (2): 46–52.
Published: 24 April 2007
...Radhalakshmi Ramakrishnan; Maqsood A. Chaudhry Purpose This paper aims to present a design of a single power supply, low voltage (1.2) high performance operational amplifier using 0.13 μm technology whose characteristics are superior compared to the other designs available...
Journal Articles
Microelectronics International (2006) 23 (3): 49–54.
Published: 01 September 2006
... PLLs derived from the two architectures can be estimated, are analysed and their future behaviours as a function of technology are predicted. Design/methodology/approach Analogue models were developed and Mentor Graphics VHDL‐AMS mixed‐signal simulations were performed on the two PLL architectures...
Journal Articles
Microelectronics International (2006) 23 (3): 3–8.
Published: 01 September 2006
...Y.H. Chan; C.C. Lim; K.T. Lau; S.H. Foo Purpose To show new design methodology of low power circuit design (Low Power Critical Voltage Transition Logic – LPCVTL) over the conventional CVTL methodology. The comparison is in terms of speed, area and power consumption. Design/methodology/approach...
Journal Articles
Microelectronics International (2005) 22 (3)
Published: 01 December 2005
... © Emerald Group Publishing Limited 2005 --> Automation Design Financing Design Automation Conference Professional Development Fund to award more than $165,000 Keywords: Automation, Design, Financing The Design Automation Conference (DAC), the electronic design...
Journal Articles
Journal Articles
Journal Articles
Journal Articles
Microelectronics International (2003) 20 (1)
Published: 01 April 2003
...Bob Willis © MCB UP Limited 2003 --> Electronics Design Manufacturing Six Sigma for Electronics Design and Manufacturing Sammy G. ShinaMcGraw-Hill, Professional Engineering Series363 pp., 11 chapters illustrated with tables and diagrams Keywords: Electronics...
Journal Articles
Microelectronics International (2000) 17 (2)
Published: 01 August 2000
... Keywords Philips Semiconductors, Design Philips Semiconductors leverages VLSI Velocity RSP to deliver a hardware/software co-design environment for its Nexperia Silicon System Platforms: By providing its entire IP portfolio in the form of a single prototyping chip on which IC...
Journal Articles
Microelectronics International (2000) 17 (2)
Published: 01 August 2000
... © MCB UP Limited 2000 --> Philips Semiconductors Design Semiconductors Silicone Keywords Philips Semiconductors, Design, Semiconductors, Silicone Philips Semiconductors announced its Sea-of-IPTM - a new design methodology for creating the complex...
Journal Articles
Microelectronics International (1999) 16 (3)
Published: 01 December 1999
... © MCB UP Limited 1999 --> Europractice Design Total solution, low-cost prototyping and small volume ASICs in 0.25 micron available to US companies Keywords Europractice, Design A new service offering low-cost access to ASIC design and manufacture is now available...
Journal Articles
Microelectronics International (1998) 15 (1): 35–38.
Published: 01 April 1998
...‐chip needs underfill for reliability enhancement, adding process steps and costs. Design of experiments (DoE) and statistical process control (SPC) are very useful tools to define the process parameters and to maintain the process quality during manufacturing. Utilizing DoE, the critical process...
Journal Articles
Microelectronics International (1996) 13 (1): 49–51.
Published: 01 April 1996
...M.J. Stoklosa The Intelligent MCM Analyser (IMCMA) is a software tool which allows the designer to concurrently assess the reliability of an MCM design based on operational parameters. Traditionally, this type of assessment takes days to accomplish and is performed after the design phase...

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