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Journal Articles
Journal:
Microelectronics International
Microelectronics International 1–11.
Published: 29 June 2026
... these VLSI challenges while delivering exceptionally fast read operations. Design/methodology/approach A novel 12T hybrid tunnel field-effect transistor ( TFET )-fin field-effect transistor (FinFET) SRAM is proposed. Unlike prior work focused on N-TFET pull-down paths, it introduces an innovative...
