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Keywords: Leakage current
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Journal Articles
Fluorine implantation for nanostructured silicon Zener diodes: a study on electrical characterization and reliability
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2026) 43 (1): 19–26.
Published: 20 November 2025
..., the Zener diode was stressed at 175 °C with an 80 µA in the reverse bias for 14 h, and the Zener voltage values were monitored every second during stressing. Parameters such as breakdown voltage, reverse leakage current, dynamic resistance, forward voltage and ideality factor were extracted from I-V...
