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1-7 of 7
Keywords: Measurement
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Journal Articles
Three axial low temperature cofired ceramic accelerometer
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2013) 30 (3): 125–133.
Published: 26 July 2013
... gravitational acceleration and the accelerometer response was measured in range ±g. The resistance sensor response is presented in Table VIII (where: ΔR – total change of resistance, 3σ – three times standard deviation, V – variability coefficient (standard deviation...
Journal Articles
Measurements and simulation of SMT components
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2003) 20 (1): 13–16.
Published: 01 April 2003
... of a representative package. Then, thermomechanical deformations of the package are measured quantitatively using state‐of‐the‐art laser‐based optoelectronic holography (OEH) methodology. The SMT components used in this study are shown in Figure 1 . More specifically, SMT packages attached to a board via gull wing...
Journal Articles
Measurement techniques for the evaluation of thick‐film materials used in wireless applications
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2001) 18 (2): 21–25.
Published: 01 August 2001
...Zhengrong Tian; Charles Free A review of the dielectric measurement techniques that are currently available for the characterization of thick film and LTCC materials at microwave and millimeter wave frequencies is presented. The intention is to show the relative advantages and limitations...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2001) 18 (1)
Published: 01 April 2001
.... Further details: MCE Tewkesbury; Tel: +44 (0) 1684 297 777; Fax: +44 (0) 1684 299 435; E-mail: sales@sia-mce.co.uk © MCB UP Limited 2001 --> MCE Sensors Measurement MCE launches low risk, low customised chips for measurement and sensing Keywords: MCE, Sensors...
Journal Articles
Substrate characterization: simulation and measurement at high microwave frequencies
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2001) 18 (1): 32–34.
Published: 01 April 2001
...Charles Free; Zhengrong Tian; Peter Barnwell In this paper we present new measured loss tangent data for commercially available substrates, and these data are supported by simulations that show how practical variations in loss tangent affect the performance of microwave interconnections and devices...
Journal Articles
Journal:
Microelectronics International
Microelectronics International (2000) 17 (1)
Published: 01 April 2000
...Professor Nihal Sinnadurai Microelectronics Measurement Rework Discovering a heroic connection Keywords: Microelectronics, Measurement, Rework A visit to Bucharest to give an invited talk on Microelectronics Education led to an unexpected encounter with a PARROT...
Journal Articles
A new method for measuring signal integrity in CMOS ICs
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2000) 17 (1): 17–21.
Published: 01 April 2000
...Sonia Delmas‐Bendhia; Fabrice Caignet; Etienne Sicard The aim of this paper is to present a new and original method for on‐chip measurements of very high frequency parasitic signals where a sampling circuit is directly included in the test chip. The paper describes the usefulness of this sensor...
