Update search
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
Filter
- All
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
NARROW
Format
Journal
Type
Date
Availability
1-2 of 2
Keywords: Polyimide
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Polyimide substrate textured by copper-seeding technique for enhanced light absorption in flexible black silicon
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (2023) 40 (1): 17–25.
Published: 15 July 2022
...Halo Dalshad Omar; Auwal Abdulkadir; Md. Roslan Hashim; Mohd Zamir Pakhuruddin Purpose This paper aims to present investigation on textured polyimide (PI) substrate for enhanced light absorption in flexible black silicon (bSi). Design/methodology/approach Flexible bSi with thickness of 60 µm...
Journal Articles
Thin‐film processing on a thick‐film multilayer
Available to Purchase
Journal:
Microelectronics International
Microelectronics International (1998) 15 (1): 11–14.
Published: 01 April 1998
... by the use of a thick‐film overglaze or by coating the surface with polyimide prior to thin‐film processing. The improvements in conductor and via yield are measured by adequate test structures with a conductor width of 25µm. Based on the results, a process is given to provide a thick‐film...
