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Keywords: Kirkendall void
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Journal Articles
Journal:
PSU Research Review
PSU Research Review: An International Journal (2019) 3 (1): 70–83.
Published: 05 November 2018
...Wei Wei Liu; Berdy Weng; Scott Chen Purpose The Kirkendall void had been a well-known issue for long-term reliability of semiconductor interconnects; while even the KVs exist at the interfaces of Cu and Sn, it may still be able to pass the condition of unbias long-term reliability testing...
