... ( FTHS ) and annular heat source ( ADHS ) models. The microstructure of the deposition samples is analyzed, and the residual stress is measured using X-ray diffraction to validate the accuracy of the numerical simulations. Findings The results show that significant differences in the residual stress...

... temperatures on the microstructure, micro-hardness and the precipitated Laves phase were studied by optical microscope (OM), scanning electron microscopy (SEM), X-ray diffraction (XRD), energy dispersive spectrometer (EDS), selected area electron diffraction (SAED), backscattered electron (BSE) imaging...