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Volume 27, Issue 3
3 July 2007
Sensor Review Cover Image for Volume 27, Issue 3
Editors
Kean Aw
Kean Aw
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Article Contents
Research Article| July 03 2007

Machine vision inspection system for film Available to Purchase

Wang Jin‐Jiang;
Wang Jin‐Jiang
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
Wang Jin‐Jiang can be contacted at: wjj@tju.edu.cn
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Wang Zheng;
Wang Zheng
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Mo Xu‐Tao;
Mo Xu‐Tao
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Wang Peng;
Wang Peng
Department of Applied Mathematics, North University of China, Taiyuan, People's Republic of China
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Liu Ming;
Liu Ming
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Ren Li;
Ren Li
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Zhu Yue;
Zhu Yue
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Zhang Fang;
Zhang Fang
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Liu Wen‐Yao
Liu Wen‐Yao
College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin, People's Republic of China Key Laboratory of Opto‐Electronics Information Technical Science, Ministry of Education, Tianjin, People's Republic of China
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Author & Article Information
Wang Jin‐Jiang can be contacted at: wjj@tju.edu.cn
Publisher: Emerald Publishing
Online ISSN: 1758-6828
Print ISSN: 0260-2288
© Emerald Group Publishing Limited
2007
Sensor Review (2007) 27 (3): 212–216.
https://doi.org/10.1108/02602280710758156
Purpose

Film is an important recording medium in industry. How to ensure film quality is a problem, because the film is produced in a dark room. Aims to focus on this.

Design/methodology/approach

An inspection system based on machine vision is presented which could assure illumination and imaging at 940 nm which is safe for film.

Findings

An objective evaluation is given using an image processing method and satisfactory results are obtained. Now, the inspection system is used by the biggest film company in China.

Originality/value

This work focuses on an important issue in film production.

Keywords:
Inspection, Films (cameras), Image sensors
© Emerald Group Publishing Limited
2007
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