Keywords: Deformation
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Journal Articles
Sensor Review (2012) 32 (4): 310–317.
Published: 07 September 2012
... for deformation imaging in conductive knitted fabric. EIT is an imaging system used to generate a map of electrical conductivity. Pressure and deformation mapping scanner is being developed based on electrical conductivity imaging of the conductive area generated in a fabric. The results are presented using...

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