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Keywords: Thermal testing
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Journal Articles
Journal:
Sensor Review
Sensor Review (2003) 23 (1): 35–39.
Published: 01 March 2003
... is associated with the time the heat takes to reach the surface of the circuit. © MCB UP Limited 2003 Thermal testing Integrated circuits Non‐destructive testing One of these setups is shown in Figure 2 . The integrated circuit under test is supplied with a positive sine voltage...
Journal Articles
Journal:
Sensor Review
Sensor Review (2002) 22 (4): 334–340.
Published: 01 December 2002
... that decides the acceptance or rejection of the parts. This setup yields thermistors with smaller size, greater part‐to‐part consistency and faster response time. Besides, the cost per part comes out to be half that of conventionally made, glass‐encapsulated thermistors. Thermal testing Sensors...
