Intelligent location of two simultaneously active acoustic emission sources: Part II

In Part I, an intelligent acoustic emission (AE) locator is described while the Part II discusses a blind source separation, time delay estimation and location of two continuous AE sources. AE analysis is used for characterization and location of developing defects in materials. AE sources often generate a mixture of various statistically independent signals. A difficult problem of AE analysis is a separation and characterization of signal components when the signals from various sources and the mode of mixing are unknown. Recently, blind source separation (BSS) by independent component analysis (ICA) has been used to solve these problems. The purpose of this paper is to demonstrate the applicability of ICA to locate two independent simultaneously active AE sources on an aluminum band specimen. The method is promising for non‐destructive testing of aircraft frame structures by AE analysis.