Image reconstruction from real scattering data Available to Purchase

This paper deals with the inverse scattering problem of reconstructing the material properties of perfectly conducting or dielectric cylindrical objects. The material properties are reconstructed from measured far‐field scattering data provided by the Electromagnetics Technology Division, AFRL/SNH, 31 Grenier Street, Hanscom AFB, MA 01731‐3010. The measured data have to be calibrated for use in our reconstruction algorithm. The inverse scattering problem formulated as unconstrained nonlinear optimization problem is numerically solved using an iterative scheme with a variable calibration factor which will be determined during the optimization process. Numerical examples show the successful application of the method to the measured data.