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Preface

Article Type: Preface From: COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, Volume 27, Issue 1.

The 7th International Symposium on Electric and Magnetic Fields, EMF 2006,was held in Aussois, France, from June 19-22, 2006. Previous editions were held in Liège (September 1992), Leuven (May 1994), Liège (May 1996),Marseille (May 1998), Ghent (May 2000) and Aachen (October 2003).

The purpose of the EMF Symposium is to throw a bridge between the recent advances of research in numerical modelling of electromagnetic fields and the growing number of industrial problems requiring such techniques. Therefore,beside classical sessions on the progress of computational methods, special sessions were devoted to advanced industrial applications of electromagnetic modelling. The topics included numerical methods and techniques, coupled problems (mechanical, thermal, and electric circuits), material modelling,optimisation and specific application oriented numerical problems.

A number of 110 papers were presented by participants coming from 27 countries. A limited number of 30 papers was selected by the EMF 2006 Scientific Committee for publication in this special issue of the COMPEL Journal.

Special thanks are due to all the members of the Scientific Committee for their valuable reviewing work as well as to the AIM (Association of Engineers from the Montefiore Electrical Institute, University of Liège)secretariat for numerous organisational aspects.

We hope that this special issue will provide various interesting information to the readers.

EMF 2006 international scientific committee

J.P.A. Bastos, Universidade Federal de Santa Catarina, Brazil

R. Belmans, Katholieke Universiteit Leuven, Belgium

O. Biro, Technische Universitaet Graz, Austria

W.A. Cronje, University of the Witwatersrand, South Africa

A. Demenko, Technical University of Poznan, Poland

P. Dular, Université de Liège, Belgium

J. Gyselinck, Université Libre de Bruxelles, Belgium

K. Hameyer, RWTH Aachen, Belgium

L. Kettunen, Tampere University of Technology, Finland

A. Kost, Universität Cottbus, Germany

V. Mazauric, Schneider Electric, France

J. Melkebeek, Universiteit Gent, Belgium

G. Meunier, Laboratoire d'Electrotechnique de Grenoble, France

G. Molinari, Universita Degli Studi di Genova, Italy

S.I. Nabeta, Universidade de Sao Paulo, Brazil

A. Nicolas, Centre de Génie Electrique de Lyon, France

A. Nicolet, Université d'Aix-Marseille III, France

F. Piriou, Université des Sciences et Technologies de Lille, France

A. Razek, Laboratoire de Génie Electrique de Paris, France

M. Repetto, Politecnico di Torino, Italy

J.K. Sykulski, University of Southampton, United Kingdom

N. Takahashi, Okayama University, Japan

M. Trlep, University of Maribor, Slovenia

K. Van Reusel, Katholieke Universiteit Leuven, Belgium

T. Weiland, Universität Darmstadt, Germany

Patrick Dular, Gérard Meunier and Francis PiriouGuest Editors

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